000 00500nam a2200193Ia 4500
008 220901s9999 xx 000 0 und d
041 _a  ENGLISH
082 _a621.395.395
082 _bCHE
100 _aCHENG, KWANG-TING
245 0 _aUNIFIED METHODS FOR VLSI SIMULATION AND TEST GENERATION.
250 _b1989
260 _aBOSTON
260 _bKLUWER ACADEMIC PUBLISHER
300 _a148
650 _a  UNIFIED METHODS FOR VLSI
700 _aAGRAWAL, VISHWANI D.
942 _cTB
999 _c136955
_d136955